Scanning probe microscope

Results: 357



#Item
191Scanning probe microscopy / Materials science / Tribology / Intermolecular forces / Nanotechnology / Atomic force microscopy / Nanotribology / Tribometer / Friction / Science / Physics / Chemistry

Chapter 6: Materials Protection and Surface Technology Unique Test Facilities Atomic Force Microscope (AFM) and Tribometer in Ultra-high Vacuum Keywords

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Source URL: www.bam.de

Language: English - Date: 2015-02-04 09:11:39
192Chemistry / Atomic force microscopy / Microscopy / Scanning tunneling microscope / Microscope / Vibrational analysis with scanning probe microscopy / Magnetic force microscope / Scanning probe microscopy / Scientific method / Science

Vis-tion_16RBK.indd

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Source URL: www.ntmdt.ru

Language: English - Date: 2013-06-11 06:31:10
193Chemistry / Intermolecular forces / Laboratory techniques / Microscopy / Atomic force microscopy / Microscope / Nanoindentation / Optical microscope / Photoconductive atomic force microscopy / Scientific method / Science / Scanning probe microscopy

Introduction to the platform Surface roughness analysis Atomic resolution imaging

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Source URL: materials.unimelb.edu.au

Language: English - Date: 2013-11-12 21:58:21
194Observational astronomy / Scattering / Spectroscopy / Scanning tunneling microscope / Electron / Physics / Condensed matter physics / Scanning probe microscopy

13th December[removed]:15 Building 28c, seminar room Sebastian Loth Max Planck Research Group – Dynamics of Nanoelectronic Systems Condensed Matter Division at CFEL

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Source URL: www.cfel.de

Language: English - Date: 2013-05-15 18:52:00
195Science / Fluorescence / Scanning probe microscopy / Near-field scanning optical microscope / Stark effect / Chemistry / Spectroscopy / Physics

Control and imaging of single-molecule spectral dynamics using a nano-electrode I. Gerhardt,∗ G. Wrigge, and V. Sandoghdar Laboratory of Physical Chemistry, ETH Zurich, CH-8093 Zurich, Switzerland Spectral dynamics (S

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Source URL: arxiv.org

Language: English - Date: 2014-01-05 03:37:12
196Scanning probe microscopy / Quantum electronics / Spintronics / Microscopes / 2DEG / Electron / Quantum Hall effect / Scanning tunneling microscope / Hall effect / Physics / Condensed matter physics / Materials science

REPORTS action were performed with a contemporary stellar evolution code, which contains the most recent physics input[removed]In particular, use of this code can produce up-to-date solar models (23) and can allow one to f

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Source URL: electron.mit.edu

Language: English - Date: 2013-01-29 17:20:54
197Chemistry / Atomic force microscopy / Microscopy / Cantilever / Piezoelectricity / Magnetic force microscope / Chemical force microscopy / Scanning probe microscopy / Science / Scientific method

Microsoft Word - AFM-10-unpersoenlich.doc

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Source URL: polymerscience.physik.hu-berlin.de

Language: English - Date: 2011-12-05 13:32:51
198Chemistry / Atomic force microscopy / Microscopy / Cantilever / Piezoelectricity / Magnetic force microscope / Chemical force microscopy / Scanning probe microscopy / Science / Scientific method

Microsoft Word - AFM-10-unpersoenlich.doc

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Source URL: polymerscience.physik.hu-berlin.de

Language: English - Date: 2011-12-08 03:26:50
199Chemistry / Intermolecular forces / Atomic force microscopy / Microscopy / Microscope / Cantilever / Amplitude / Magnetic force microscope / Piezoresponse force microscopy / Scanning probe microscopy / Science / Scientific method

Atomic Force Microscopy on biological samples Karls-Ruprecht Universität Heidelberg Kirchhof-Institut für Physik[removed]Im Neuenheimer Feld 227 D[removed]Heidelberg

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Source URL: malone.bioquant.uni-heidelberg.de

Language: English - Date: 2005-04-11 12:32:47
200Chemistry / Nanotechnology / Magnetic force microscope / Atomic force microscopy / Cantilever / Focused ion beam / Microscopy / Scanning joule expansion microscopy / Thermal Probe Lithography / Scientific method / Scanning probe microscopy / Science

IEEE TRANSACTIONS ON MAGNETICS, VOL. 38, NO. 5, SEPTEMBER[removed]The CantiClever: A Dedicated Probe for Magnetic Force Microscopy

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Source URL: doc.utwente.nl

Language: English - Date: 2011-08-28 10:51:13
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